Measuring electric fields with 4D-STEM: Demonstration of pitfalls by the example of GaN and SiGeTim Grieb, Christoph Mahr, Florian F. Krause, Knut Müller-Caspary, Marco Schowalter, Martin Eickhoff and Andreas RosenauerBIO Web Conf., 129 (2024) 07023DOI: https://doi.org/10.1051/bioconf/202412907023