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Cited article:

A Novel Tool for Combined AFM, SEM, and Electrical Probing of Nanostructures

Chris Schwalb, Hajo Frerichs, Darshit Jangid, Sebastian Seibert, Lukas Stühn, Marion Wolff, Andrew Jonathan Smith, Andreas Rummel

BIO Web Conf., 129 (2024) 05011

Published online: 2024-10-17

DOI: https://doi.org/10.1051/bioconf/202412905011

This article has been cited by the following article(s):

Advances in correlative microscopy and next-generation devices toward the CHIPS Act

Christian H. Schwalb, Afshin Alipour, Kerim T. Arat, Randy K. Dumas, Darshit Jangid, Md. Ashiqur Rahman Laskar, Srijan Chakrabarti, William K. Neils, Sanchari Sen, Stefano Spagna and Umberto Celano
Applied Physics Reviews 12 (4) (2025)
https://doi.org/10.1063/5.0287947