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Cited article:

Multiscale Microscopy via Automation: Dual Magnification Environmental Scanning Electron Microscopy Imaging by Frame Alternation

Maurits Vuijk, Johannes Zeininger, Luis Sandoval‐Diaz, Günther Rupprechter, Beatriz Roldan Cuenya, Karsten Reuter, Thomas Lunkenbein and Christoph Scheurer
Advanced Materials Technologies 11 (13) (2026)
https://doi.org/10.1002/admt.202600009