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Sequential tilting 4D-STEM for reliable electric field mapping across junctions

Christoph Flathmann, Ulrich Ross, Andreas Beyer, Jürgen Belz, Kerstin Volz, Michael Seibt and Tobias Meyer

BIO Web Conf., 129 (2024) 04018

DOI: https://doi.org/10.1051/bioconf/202412904018

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