Texture analysis of radiation sensitive organic films: Comparative study by electron diffraction tomography and GIWAXS
Irene Kraus, Mingjian Wu, Stefanie Rechberger, Johannes Will, Santanu Maiti, Andreas Kuhlmann, Marten Huck, Marc Steinberger, Christoph Brabec, Hans-Georg Steinrück, Tobias Unruh and Erdmann Spiecker