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Breaking the limits of functional Atomic Force Microscopy imaging using Focused Electron Beam Induced Deposition

Michele Brugger-Hatzl, Lukas Seewald, Robert Winkler, David Kuhness, Michael Huth, Sven Barth and Harald Plank

BIO Web Conf., 129 (2024) 10002

DOI: https://doi.org/10.1051/bioconf/202412910002

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