In-situ electrical characterization of MOSFET transistors using AFM-in-SEM solutionOndrej Novotny, Libor Strakos, Marek Patocka, Vojtech Schanilec, Veronika Hegrova, Umberto Celano, Tomas Vystavel and Jan NeumanBIO Web Conf., 129 (2024) 24023DOI: https://doi.org/10.1051/bioconf/202412924023