Strain analysis comparison in complementary and nanosheet field-effect transistor devices: Nanobeam vs Bessel electron diffractionPaola Favia, Anabela Veloso, Geert Eneman, Ankit Nalin Mehta, Xiuju Zhou, Olivier Richard, Jef Geypen and Eva GrietenBIO Web Conf., 129 (2024) 24025DOI: https://doi.org/10.1051/bioconf/202412924025