Characterization of 2DEG on WG semiconductors through sub-sampled 4DSTEM
Giuseppe Nicotra, Gianfranco Sfuncia, Alex Robinson W, Daniel Nicholls, Jack Wells, Antonio Mio M, Corrado Bongiorno, Cettina Bottari, Salvatore Adamo, Alfio Russo, Santi Alessandrino, Nigel Browning D and Corrado Spinella
