Electron microscopy characterization of grain boundaries in Nb1-xTixFeSb based half-Heusler thermoelectric materialsDominique Mattlat, Ruben Bueno Villoro, Chanwon Jung, Raana Hatami Naderloo, Ran He, Kornelius Nielsch, Duncan Zavanelli, G. Jeffrey Snyder, Siyuan Zhang and Christina ScheuBIO Web Conf., 129 (2024) 25055DOI: https://doi.org/10.1051/bioconf/202412925055