A Novel Tool for Combined AFM, SEM, and Electrical Probing of NanostructuresChris Schwalb, Hajo Frerichs, Darshit Jangid, Sebastian Seibert, Lukas Stühn, Marion Wolff, Andrew Jonathan Smith and Andreas RummelBIO Web Conf., 129 (2024) 05011DOI: https://doi.org/10.1051/bioconf/202412905011