Sequential tilting 4D-STEM for reliable electric field mapping across junctions Christoph Flathmann, Ulrich Ross, Andreas Beyer, Jürgen Belz, Kerstin Volz, Michael Seibt and Tobias Meyer BIO Web Conf., 129 (2024) 04018 Published online: 17 October 2024 DOI: 10.1051/bioconf/202412904018