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Electron microscopy characterization of grain boundaries in Nb1-xTixFeSb based half-Heusler thermoelectric materials

Dominique Mattlat, Ruben Bueno Villoro, Chanwon Jung, Raana Hatami Naderloo, Ran He, Kornelius Nielsch, Duncan Zavanelli, G. Jeffrey Snyder, Siyuan Zhang and Christina Scheu

BIO Web Conf., 129 (2024) 25055

Published online: 17 October 2024

DOI: 10.1051/bioconf/202412925055

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