| Issue |
BIO Web Conf.
Volume 129, 2024
The 17th European Microscopy Congress (EMC 2024)
|
|
|---|---|---|
| Article Number | 05014 | |
| Number of page(s) | 2 | |
| Section | New Instrumentation | |
| DOI | https://doi.org/10.1051/bioconf/202412905014 | |
| Published online | 17 October 2024 | |
Development of a pixelated STEM-in-SEM detector for microstructural features characterization
1 JEOL (Europe) SAS, 1 All. de Giverny, 78290 Croissy, France
2 Laboratoire d’Etude des Microstructures et de Mécanique des Matériaux (LEM3), Université de Lorraine, CNRS UMR 7239, Arts et Métiers, F-57070 Metz, France
3 Laboratory of Excellence on Design of Alloy Metals for low-mAss Structures (DAMAS), University of Lorraine, 57073 Metz, France
This article has no abstract.
Key words: Electron microscopy / STEM-in-SEM / On-Axis TKD / Microstructures characterization
© The Authors, published by EDP Sciences, 2024
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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