| Issue |
BIO Web Conf.
Volume 129, 2024
The 17th European Microscopy Congress (EMC 2024)
|
|
|---|---|---|
| Article Number | 07023 | |
| Number of page(s) | 3 | |
| Section | Diffraction Techniques and Structural Analysis | |
| DOI | https://doi.org/10.1051/bioconf/202412907023 | |
| Published online | 17 October 2024 | |
Measuring electric fields with 4D-STEM: Demonstration of pitfalls by the example of GaN and SiGe
1 Institute of Solid State Physics, University of Bremen, Bremen, Germany
2 MAPEX Center for Materials and Processes, University of Bremen, Bremen, Germany
3 Department of Chemistry and Centre for NanoScience, Ludwig-Maximilians-Universität München, Munich, Germany
This article has no abstract.
Key words: 4D-STEM / COM / electric fields
© The Authors, published by EDP Sciences, 2024
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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