| Issue |
BIO Web Conf.
Volume 212, 2026
1st International Conference on Environment, Energy, and Materials for Sustainable Development (IC2EM-SDT’25)
|
|
|---|---|---|
| Article Number | 01030 | |
| Number of page(s) | 5 | |
| DOI | https://doi.org/10.1051/bioconf/202621201030 | |
| Published online | 23 January 2026 | |
Intelligent defect detection in electroluminescence images of photovoltaic modules using MobileNetV2
Laboratory of Materials, Waves, Energy and Environment, Faculty of Sciences, Mohammed First University, Oujda, Morocco
* Corresponding author: This email address is being protected from spambots. You need JavaScript enabled to view it.
With the rapid growth of the photovoltaic (PV) industry, fast and accurate defect-detection techniques are becoming increasingly important. Manual inspection of PV modules using electroluminescence (EL) imaging is time-consuming and prone to errors. This study proposes a clever method for detecting defects using a lightweight deep learning model based on the MobileNetV2 architecture. The model learns from a dataset of EL images showing two common types of defects: cracks and dark areas. It also contains defect-free cells. To improve robustness to typical EL acquisition variability, an EL-tailored data augmentation pipeline is applied, including geometric transformations and photometric adjustments (brightness and contrast). During testing, it takes only 0.913 seconds to predict an image. This demonstrates a good compromise between speed and accuracy. This approach offers a promising solution for low-cost, near-real-time quality inspection of photovoltaic modules using artificial intelligence.
Key words: Photovoltaic modules (PV) / electroluminescence imaging (EL) / defect detection / deep learning / MobileNetV2
© The Authors, published by EDP Sciences, 2026
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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